Application of High-Frequency EPR Spectroscopy for the Identification and Separation of Nitrogen and Vanadium Sites in Silicon Carbide Crystals and Heterostructures
2020
, Semiconductors, v.54, 1
ISSN: 1063-7826
Страницы:
150 - 156
Авторы:Edinach,EV; Krivoruchko,AD; Gurin,AS; Muzafarova,MV; Ilyin,IV; Babunts,RA; Romanov,NG; Badalyan,AG; Baranov,PG
Авторы (ФТИ):Edinach,EV; Krivoruchko,AD; Gurin,AS; Muzafarova,MV; Ilyin,IV; Babunts,RA; Romanov,NG; Badalyan,AG; Baranov,PG
Подразделения:
DOI:http://dx.doi.org/10.1134/S1063782620010066
Scopus® times cited:1
Scopus® ID:2-s2.0-85081535218
Web of Science® times cited:1
Web of Science® ID:WOS:000518802700026
Полный текст:http://dx.doi.org/10.1134/S1063782620010066