Dielectric coatings for elementary charge fluctuation studies testing with Kelvin probe microscopy
2025 , Semiconductors, v.59, 6
International Conference PhysiсA.SPb; St. Petersburg, Russia; 20-24 October 2025
ISSN: 1063-7826

Страницы: 304 - 308
Авторы:Rodin,VD; Aksenov,VYu; Ankudinov,AV; Bolshakov,VO; Vlasov,AS; Zharova,YuA; Ulkiv,IV; Levin,RV; Malevskaya,AV; Mintairov,AM
Авторы (ФТИ):Rodin,VD; Aksenov,VYu; Ankudinov,AV; Bolshakov,VO; Vlasov,AS; Zharova,YuA; Levin,RV; Malevskaya,AV; Mintairov,AM
Подразделения: DOI:https://doi.org/10.61011/SC.2025.06.62054.8008
Полный текст:https://doi.org/10.61011/SC.2025.06.62054.8008