Intrinsic defects in ZnO: A study using optical detection of electron paramagnetic resonance
2006 , Physica B, v.376-377, 1
23rd International Conference on Defects in Semiconductors
ISSN: 0921-4526

Страницы: 677 - 681
Авторы:Vlasenko,LS; Watkins,GD
Авторы (ФТИ):Vlasenko,LS DOI:http://dx.doi.org/10.1016/j.physb.2005.12.170 Scopus® times cited:20 Scopus® ID:2-s2.0-33645226323 Web of Science® times cited:18 Web of Science® ID:WOS:000237329500167
Полный текст:http://dx.doi.org/10.1016/j.physb.2005.12.170