Laboratory of Quantum-size heterostructures

Surface Analysis Group

The Surface Analysis Group at Ioffe Physico-Technical Institute was created in 1990. The group carries out research projects in the field of surface-sensitive techniques and their applications. The group also carries out researches and diagnostic in various surface/interface-related subjects in collaboration with scientists within Ioffe Institute and with academic institutes, universities, innovation enterprises and manufacturers in Russia and in other countries.

Areas of application include investigations of coatings, thin films, various semiconductor structures based on SiGe, SiC, Si:Er, III-V compounds based on (AlGa)As, (InGa)(AsP), (InGa)(AsSb), (InAlGa)N, II-VIs, microelectronic and optoelectronic device structures (light-emitting diodes, diode heterolasers, HEMTS, photorecievers, solar cells, multy-quantum-well structures, structures with planar-doping, etc.), metal-semiconductor structures.

A surface, interface and in-depth profiling analysis of the chemical states and of concentrations of matrix elements, dopants, and impurities is performed using dynamic SIMS, XPS, AES, and REELS surface-sensitive techniques.

Surface-sensitive techniques and instrumentation

The Surface Analysis Group is well equipped with modern analytical instruments:
  • Secondary Ion Mass Spectrometry (SIMS) in dynamic mode is performed using CAMECA IMS 4f and IMS 7f Ion Microprobes/Microscopes equipped with oxygen and cesium primary sources.
  • X-ray photoelectron spectroscopy, Auger electron spectroscopy, and Reflection Electron Energy Loss Spectroscopy, are performed using Physical Electronics PHI Multitechnique 5500 electron spectrometer equipped with a hemispherical electron analyzer and a multichannel detector, a double-anode Mg/Al X-ray source, a monochromatized AlKα X-ray source, scanning electron and ion guns.

The Surface Analysis Group is a member of the Russian North-West Regional Center of Shared Equipment "Characterization for Material Science and Advanced Technologies".


    Boris BER, Head of the Surface Analysis Group,
    The Center for the Physics of Nanoheterostructures
    Ioffe Physico-Technical Institute of the Russian Academy of Sciences,
    26 Polytechnicheskaya St.,
    St Petersburg, 194021,
    The Russian Federation
    Tel: +7-(812) 292 7362,
    Fax: +7-(812) 297 1017,