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Власенко Леонид Сергеевич
Dynamic nuclear polarization of Si-29 nuclei in isotopically controlled phosphorus doped silicon. Phys. Rev. B, v.80, 4, 2009, ArtNo: #045201
http://dx.doi.org/10.1103/PhysRevB.80.045201
Persistent photoconductivity and electron paramagnetic resonance in zinc oxide ceramics. J. Appl. Phys., v.106, 1, 2009, ArtNo: #013712
http://dx.doi.org/10.1063/1.3159646
Nuclear magnetic resonance linewidth and spin diffusion in Si-29 isotopically controlled silicon. Phys. Rev. B, v.78, 15, 2008, ArtNo: #153201
http://dx.doi.org/10.1103/PhysRevB.78.153201
Optical detection of magnetic resonance and electron paramagnetic resonance study of the oxygen vacancy and lead donors in ZnO. J. Appl. Phys., v.103, 12, 2008, ArtNo: #123709
http://dx.doi.org/10.1063/1.2942403
Effect of illumination on magnetization and microwave absorption of La1-xCaxMnO3 (x<0.2) films. J. Magn. Magn. Mater., v.320, 11, 2008, p. 1747 - 1752
http://dx.doi.org/10.1016/j.jmmm.2008.01.038
Dynamic nuclear polarization of 29Si nuclei in the isotope enriched n-type silicon. Phys. Status Solidi C Curr. Top. Solid State Phys., v.3, 12, 2006, p. 4388 - 4391
ce on Physics and Applications of Spin-Related Phenomena in Semiconductors (PASP-IV); Sendai, Japan; August 15-18, 2006
http://dx.doi.org/10.1002/pssc.200672823
Electron paramagnetic resonance and dynamic nuclear polarization via the photoexcited triplet states of radiation defects in natural and Si-29 isotope enriched silicon. Phys. Status Solidi C Curr. Top. Solid State Phys., v.3, 12, 2006, p. 4376 - 4379
4th International Conference on Physics and Applications of Spin-Related Phenomena in Semiconductors (PASP-IV) Location: Sendai, JAPAN Date: AUG 15-18, 2006
http://dx.doi.org/10.1002/pssc.200672809
Intrinsic defects in ZnO: A study using optical detection of electron paramagnetic resonance. Physica B, v.376-377, 1, 2006, p. 677 - 681
23rd International Conference on Defects in Semiconductors
http://dx.doi.org/10.1016/j.physb.2005.12.170
Optical detection of electron paramagnetic resonance for intrinsic defects produced in ZnO by 2.5-MeV electron irradiation in situ at 4.2 K. Phys. Rev. B, v.72, 3, 2005, ArtNo: #035203
http://dx.doi.org/10.1103/PhysRevB.72.035203
Origin of the 6885-cm(-1) luminescence lines in ZnO: Vanadium versus copper. Phys. Rev. B, v.71, 11, 2005, ArtNo: #115205
http://dx.doi.org/10.1103/PhysRevB.71.115205
Optical detection of electron paramagnetic resonance in room-temperature electron-irradiated ZnO. Phys. Rev. B, v.71, 12, 2005, ArtNo: #125210
http://dx.doi.org/10.1103/PhysRevB.71.125210
Intrinsic defects in GaN. I. Ga sublattice defects observed by optical detection of electron paramagnetic resonance. Phys. Rev. B, v.69, 4, 2004, ArtNo: #045207
http://dx.doi.org/10.1103/PhysRevB.69.045207
Intrinsic defects in GaN. II. Electronically enhanced migration of interstitial Ga observed by optical detection of electron paramagnetic resonance. Phys. Rev. B, v.69, 4, 2004, ArtNo: #045208
http://dx.doi.org/10.1103/PhysRevB.69.045208
Spin-dependent recombination electron paramagnetic resonance spectroscopy of defects in irradiated silicon detectors. J. Appl. Phys., v.93, 12, 2003, p. 9659 - 9664
http://dx.doi.org/10.1063/1.1576488
Defects observed by optical detection of electron paramagnetic resonance in electron-irradiated p-type GaN. Phys. Rev. B, v.65, 20, 2002, ArtNo: #205202
http://dx.doi.org/10.1103/PhysRevB.65.205202
New low symmetry configuration of the two carbon-interstitial silicon complex in irradiated silicon. Solid State Commun., v.124, 10-11, 2002, p. 403 - 406
http://dx.doi.org/10.1016/S0038-1098(02)00574-4
Conductivity of La1-xCaxMnO3 under magnetic resonance of Mn ions. ФТТ, т.43, 3, 2001, p. 471 - 473
Conductivity of La1-xCaxMnO3 under magnetic resonance of Mn ions. Phys. Solid State, v.43, 3, 2001, p. 489 - 492
http://dx.doi.org/10.1134/1.1356125
Поверхностное геттерирование фоновых примесей и дефектов в пластинах GaAs. ФТП, т.35, 2, 2001, с. 184 - 187
Surface gettering of background impurities and defects in GaAs wafers. Semiconductors, v.35, 2, 2001, p. 177 - 180
http://dx.doi.org/10.1134/1.1349927
Диагностика высокоомных пластин GaAs методом микроволновой фотопроводимости. Письма ЖТФ, т.27, 1, 2001, с. 19 - 23
Diagnostics of high-resistivity GaAs wafers by microwave photoconductivity. Tech. Phys. Lett., v.27, 1, 2001, p. 9 - 10
http://dx.doi.org/10.1134/1.1345152
Field-modulated microwave absorption in thin YBaCuO films. Physica B, v.284, Part 1, 2000, p. 949 - 950
http://dx.doi.org/10.1016/S0921-4526(99)02265-6